22 results
Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 859-860
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- August 2015
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Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 843-844
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- August 2015
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Compositional and Structural Analysis of Al-doped ZnO Multilayers by LEAP
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 526-527
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- August 2014
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Correlative Compositional Analysis of Fiber-Optic Nanoparticles
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 994-995
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- August 2014
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Elemental Quantification and Visualization of GaN Structures using APT and SIMS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2112-2113
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- August 2014
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New Applications in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1022-1023
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- August 2013
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Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 740-741
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- July 2011
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Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 750-751
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- July 2011
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Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 738-739
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- July 2011
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Improved Yield and Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 714-715
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- July 2011
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MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 754-755
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- July 2011
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Toward Automated Optimization of Reconstruction of Atom Probe Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 724-725
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- July 2011
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Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 760-761
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- July 2011
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Analytic Hitmap Equation of the Ideal Spherical Evaporator
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 728-729
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- July 2011
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Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 752-753
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- July 2011
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Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 456-457
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- August 2008
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Recent Advances in Analysis of Organic Materials using LEAPÆ Tomography
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 190-191
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- August 2007
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Compositional Imaging at the Atomic Scale with Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1398-1399
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- August 2006
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A Correlative Study of an Iron-Base Superalloy Using Transmission Electron Microscopy and Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1748-1749
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- August 2006
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An Automatic Electropolishing System for Needle-Shaped Specimens
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1750-1751
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- August 2006
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